The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Dec. 20, 2006
Udo Klein, Maximiliansau, DE;
Thomas Wieczorek, Meckesheim, DE;
Daniel Zimmermann, Leimen, DE;
Oliver Sievi, Sandhausen, DE;
Guenter Pecht-seibert, Muehlhausen, DE;
Udo Klein, Maximiliansau, DE;
Thomas Wieczorek, Meckesheim, DE;
Daniel Zimmermann, Leimen, DE;
Oliver Sievi, Sandhausen, DE;
Guenter Pecht-Seibert, Muehlhausen, DE;
SAP AG, Walldorf, DE;
Abstract
A method and system for graphical analysis to detect anomalies in process objects. The method generates a graph to represent a set of process objects, applies a clustering algorithm to cluster like nodes of the graph, compares the clusters to the process objects, and, if the objects match the clusters, accepts the objects for further review or for use in applications. If one or more of the objects do not match the clusters, such suggests that there are anomalies in the process objects requiring correction. An example implementation may be to detect anomalies in the design of the process objects.