The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Oct. 08, 2007
Marcus Wefers, Heidelberg, DE;
Stephan Daub, Walldorf, DE;
Marcus Wefers, Heidelberg, DE;
Stephan Daub, Walldorf, DE;
SAP AG, Walldorf, DE;
Abstract
Methods and apparatuses enable comparing a current system configuration of a test system with a previous system configuration to determine whether differences exist between the two configurations and information about the technical objects used when performing a business transaction. The comparison can be performed via configuration metadata available for both the current and previous system configurations. A comparison result is generated to indicate any differences between the two system configurations. In one embodiment, the comparison result is used to identify a parameter of a test component that is affected by the differences in system configuration. Based on the differences in system configuration, the affected parameter is adapted by a test manager. A test case is updated based on the adapted test component responsive to the detected difference. Thus, the test system can be dynamic and adaptive.