The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Oct. 31, 2007
Michael L. Behm, Cedar Park, TX (US);
Carol I. Gabele, Austin, TX (US);
Derek E. Williams, Austin, TX (US);
Michael L. Behm, Cedar Park, TX (US);
Carol I. Gabele, Austin, TX (US);
Derek E. Williams, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A design is simulated utilizing a hardware description language (HDL) simulation model by stimulating the HDL simulation model with a testcase. The HDL simulation model includes instrumentation not forming a portion of the design that includes a count event counter for a count event in the design, and the simulation includes counting occurrences of the count event in the count event counter to obtain a count event value. A threshold is also established for an aggregate count event value for the count event counter. After completion of the testcase, a determination is made whether addition of the count event value to the aggregate count event value for the count event counter would cause the aggregate count event value to exceed the threshold. If not, the count event value is recorded in a testcase data storage area, and the count event value is accumulated in the aggregate count event value. If so, the count event value is discarded without recording the count event value in the testcase data storage area.