The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Sep. 21, 2007
Tadayuki Yamaguchi, Kobe, JP;
Atsushi Shirakami, Miki, JP;
Etsuro Shinkai, Kobe, JP;
Yasuhiro Ochi, Miki, JP;
Tadayuki Yamaguchi, Kobe, JP;
Atsushi Shirakami, Miki, JP;
Etsuro Shinkai, Kobe, JP;
Yasuhiro Ochi, Miki, JP;
Sysmex Corporation, Kobe, JP;
Abstract
A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.