The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Dec. 03, 2004
Applicants:

John Francis Petrilla, Palo Alto, CA (US);

Patrick T. Petruno, San Jose, CA (US);

Daniel B. Roitman, Menlo Park, CA (US);

Rong Zhou, Sunnyvale, CA (US);

Michael John Brosnan, Fremont, CA (US);

Inventors:

John Francis Petrilla, Palo Alto, CA (US);

Patrick T. Petruno, San Jose, CA (US);

Daniel B. Roitman, Menlo Park, CA (US);

Rong Zhou, Sunnyvale, CA (US);

Michael John Brosnan, Fremont, CA (US);

Assignee:

Alverix, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/543 (2006.01); C12Q 1/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A read-write assay system includes providing an assay device; and writing assay device information to the assay device for subsequent reading of the assay device information from the assay device; or performing an assay with the assay device and subsequent writing of the assay related information to the assay device or reading of assay related information from the assay device.


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