The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Mar. 17, 2008
Applicants:

Takashi Ohmiya, Nagoya, JP;

Kentaro Murayama, Kasugai, JP;

Tetsuya Okano, Anjo, JP;

Inventors:

Takashi Ohmiya, Nagoya, JP;

Kentaro Murayama, Kasugai, JP;

Tetsuya Okano, Anjo, JP;

Assignee:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 15/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

During a first operation, at least one of a first pattern and a second pattern is formed on a first area of an image carrier, and at least the other pattern is formed on a second area of the image carrier. The first area corresponds to a half of the image carrier, while the second area corresponds to the remaining half of the image carrier. During a second operation, a second pattern is formed on an area of the image carrier where a first pattern is formed during the first operation, and a first pattern is formed on an area of the image carrier where a second pattern is formed during the first operation.


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