The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Dec. 20, 2007
Raviv Weber, Herzliya, IL;
Amiad Dvir, Nes Ziona, IL;
Eli Elmoalem, Nili, IL;
Alex Goldstein, Netanya, IL;
Igor Elkanovich, Tel Mond, IL;
David Avishai, Nes Ziona, IL;
Raviv Weber, Herzliya, IL;
Amiad Dvir, Nes Ziona, IL;
Eli Elmoalem, Nili, IL;
Alex Goldstein, Netanya, IL;
Igor Elkanovich, Tel Mond, IL;
David Avishai, Nes Ziona, IL;
Broadlight, Ltd., Herzliya, IL;
Abstract
Apparatus and method to measure the quality of burst signals and to perform optical line diagnostics in and optical passive optical network (PON). Statistical information about phase noise (jitter), signal distortion, clock distortions, and any other effects present in burst signals is generated. The statistics are based on phase and bit-length distortions, direction and length of the effect as detected by a phase error detector integrated in a burst mode clock and data recovery (BCDR) circuit. The invention can be further adapted to perform optical line diagnostics to detect the root cause performance degradation and failures in the PON, thereby providing an optical layer supervision tool for monitoring the PON. The statistical information can be used to estimate the quality of service (QoS) per customer connected to the PON. In addition, the generated statistic information can be used to calibrate transmission parameters of optical network unit (ONU) transmitters.