The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Jun. 02, 2005
Thomas Andreas Maria Kevenaar, Eindhoven, NL;
Antonius Hermanus Maria Akkermans, Eindhoven, NL;
Thomas Andreas Maria Kevenaar, Eindhoven, NL;
Antonius Hermanus Maria Akkermans, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The present invention relates to a method and a system of determining correspondence between location sets. A basic idea of the present invention is to provide a scheme in which correspondence between location sets is determined. A feature location set (X) comprising a number (n+1) of components is transformed into a feature vector that can be used in an HDS. Therefore, a feature density function (ƒ(x)) is created. A feature vector (X) for the HDS is chosen to be a sampled version of the feature density function (ƒ(x) ), which results in feature vectors of equal and finite dimensions regardless of the number (n+1) of features that are present in the biometric template Xfrom which the location sets is derived. Thereafter, a distance (d) between two feature location sets (X, Y) is determined. The distance (d) between the sets is chosen to be the Euclidian distance between the corresponding feature density functions.