The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Mar. 13, 2007
Applicant:
Koichi Kinoshita, Kyoto, JP;
Inventor:
Koichi Kinoshita, Kyoto, JP;
Assignee:
Omron Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A device and method for detecting feature points of an object from an image. A three-dimensional model is created in which a plurality of nodes corresponding to feature points in a learning image are defined. The model is projected onto an input image and a feature value is derived from a plurality of sampling points around a projection point of each node. An error estimated amount is computed based on the displacement of a feature point between a correct model and an error model. The three dimensional position of each feature point in the input image is estimated based on the error estimated amount and a three dimensional model.