The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Apr. 29, 2009
Kuan-ting Chen, Taipei Hsien, TW;
Chun-hsiang Huang, Taipei Hsien, TW;
Hsin-tsung Yeh, Taipei Hsien, TW;
Wei-hsiu Chang, Taipei Hsien, TW;
Kuang-wei Lin, Taipei Hsien, TW;
Mei-chun Lin, Taipei Hsien, TW;
Kuan-Ting Chen, Taipei Hsien, TW;
Chun-Hsiang Huang, Taipei Hsien, TW;
Hsin-Tsung Yeh, Taipei Hsien, TW;
Wei-Hsiu Chang, Taipei Hsien, TW;
Kuang-Wei Lin, Taipei Hsien, TW;
Mei-Chun Lin, Taipei Hsien, TW;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
An antireflection film includes a first layer, a second layer, a third layer, a fourth layer, a fifth layer, a sixth layer, and a seventh layer. Each of the first, third, fifth, and seventh layer is formed using a low refractive index material. Each of the second, fourth, and sixth layer is formed using a high refractive index material. The thicknesses of the first, second, third, fourth, fifth, sixth, and seventh layers are in ranges of 0.122dto 3.052d, 0.267dto 0.370d, 0.427dto 0.610d, 0.760dto 0.924d, 0.305dto 0.378d, 0.575dto 0.718d, and 1.160dto 1.342d, correspondingly, wherein d=λ/(4×n), (i=1, 2, . . . 7), nis a refractive index of the i-th layer, and λ is a reference wavelength of incident light entered into the antireflection film.