The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Sep. 04, 2008
Kazuhiko Iwaki, Shizuoka, JP;
Takayuki Takeda, Tokyo, JP;
Kazuhiko Iwaki, Shizuoka, JP;
Takayuki Takeda, Tokyo, JP;
NEC Access Technica, Ltd., Shizuoka, JP;
NEC Engineering, Ltd., Tokyo, JP;
Abstract
An edge detecting device for detecting a position of an edge of an object includes a measuring circuit for emitting an inspection light to a linear inspecting area including the object, and measuring first light quantity of a reflected light of the inspection light reflected from the inspecting area in a first state and second light quantity of a reflected light of the inspection light reflected from the inspecting area in a second state, a calculation circuit for calculating a difference of the first light quantity and the second light quantity measured by the measuring circuit for each pixel with a first predetermined length, calculating first total differences of reflected lights from pixels with a second predetermined length located adjacent to an objective dot in one direction by totalizing differences between the first and the second light quantity reflected from each of the pixels, and calculating second total differences of reflected lights from the other pixels with the second predetermined length located adjacent to the objective dot in the other direction by totalizing differences between the first and the second light quantity reflected from each of the other pixels and a judgment circuit for judging the objective dot with the largest variation between the first total differences and the second total differences to be a position of the edge.