The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Jun. 27, 2007
Applicants:

Thomas G. Malzbender, Palo Alto, CA (US);

Oliver Wang, Santa Cruz, CA (US);

Ruth Bergman, Haifa, IL;

Justin Tehrani, Loveland, CO (US);

Inventors:

Thomas G. Malzbender, Palo Alto, CA (US);

Oliver Wang, Santa Cruz, CA (US);

Ruth Bergman, Haifa, IL;

Justin Tehrani, Loveland, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Images of a document having a surface are captured. In this process, multiple scan lines respectively illuminated from different illumination angles relative to the document surface are scanned across the document surface in a first scan direction in relation to orientation of the document. Multiple scan lines respectively illuminated from different illumination angles relative to the document surface are scanned across the document surface in a second scan direction in relation to orientation of the document. The captured images are generated from scan line illumination reflected from the document surface during the scanning of respective ones of the scan lines across the document surface. A crease or a tear is detected in the document based on the captured images.


Find Patent Forward Citations

Loading…