The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Apr. 06, 2009
Tian Chen, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Xiaoming Du, Shanghai, CN;
Jianming Zheng, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
James Allen Baird, Amelia, OH (US);
Xinjue Zou, Shanghai, CN;
Kevin William Meyer, Cincinnati, OH (US);
Tian Chen, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Xiaoming Du, Shanghai, CN;
Jianming Zheng, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
James Allen Baird, Amelia, OH (US);
Xinjue Zou, Shanghai, CN;
Kevin William Meyer, Cincinnati, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.