The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Dec. 13, 2006
Applicants:

Shinsuke Nezaki, Kyoto, JP;

Masashi Murakami, Kyoto, JP;

Inventors:

Shinsuke Nezaki, Kyoto, JP;

Masashi Murakami, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 3/14 (2006.01); H04N 5/335 (2011.01);
U.S. Cl.
CPC ...
Abstract

An object of the present invention is to provide a solid-state imaging device and driving method thereof capable of suppressing image quality defect caused by a coupling which occurs when a readout transistor that controls signal charge readout from a photodiode. The solid-state imaging device is an amplifying solid-state imaging device which includes: a unit cell having a readout transistor which reads signal charge from the photodiode, which outputs an amplifier signal corresponding to the signal charge; a first vertical signal line and a second vertical signal line connected to the unit cell; a sampling capacity which accumulates amplifier signals transmitted via the first vertical signal line and the second vertical signal line; a bias current supply, a coupling control transistor, and a coupling control circuit, which prevent transmission of the amplifier signal from the unit cell to the sampling capacity either at the start or the end of the signal charge readout by the readout transistor.


Find Patent Forward Citations

Nezaki, Shinsuke. (2011). Solid-state imaging device and driving method thereof that prevents image quality defect caused by coupling occuring when signal charge is read out from photodiode (U.S. Patent No. 7924331). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7924331

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