The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Jun. 18, 2008
Shoichi Kajiwara, Osaka, JP;
Hiroyuki Tani, Osaka, JP;
Shoichi Kajiwara, Osaka, JP;
Hiroyuki Tani, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
An electromagnetic wave measuring method is provided that is capable of performing high-precision measurement in a shorter time and in a greater variety of frequency bands than heretofore with a comparatively simple configuration. A plate-like antenna () of which the outline shape of an opposed surface opposite a measured object () is similar to the outline shape of an opposed surface of the measured object () is brought close to the measured object (), and an electromagnetic wave from the measured object () is measured based on the frequency spectrum of a received signal received by the plate-like antenna ().