The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Jan. 09, 2008
Applicant:
Wenmiao LU, Palo Alto, CA (US);
Inventor:
Wenmiao Lu, Palo Alto, CA (US);
Assignee:
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for mapping field inhomogeneity for forming a magnetic resonance image is provided. A magnetic resonance excitation is applied. A plurality of k-space echoes signals is acquired. A periodic cost function is calculated from the acquired plurality of k-space echo signals. A period of the calculated periodic cost function is divided into multiple regions. A search algorithm is used to locate a local minimum in each region. Located local minimums are chosen to provide global smoothness.