The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Apr. 02, 2009
Applicants:

Richard W. Walker, Alpine, UT (US);

David W. Farley, Orem, UT (US);

Jeff M. Elrod, Seattle, WA (US);

Inventors:

Richard W. Walker, Alpine, UT (US);

David W. Farley, Orem, UT (US);

Jeff M. Elrod, Seattle, WA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 13/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to an instrument having at least one terminal post having a longitudinal axis extending therefrom such that the longitudinal axis is at an oblique angle relative to a surface of the instrument. In one embodiment, each terminal post is mounted to a circuit board such that a first surface of each terminal post projects in a first direction. In this embodiment, a rear surface of each terminal post is beveled and coupled to a first surface of the circuit board. The beveled rear surface of the terminal posts defines the oblique angle at which the longitudinal axis of the each terminal post is relative to a surface of the instrument.


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