The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
May. 06, 2009
Robert Essenreiter, München, DE;
Michael Bertram, Markt Schwaben, DE;
Martin Ringholz, Erlangen, DE;
Robert Essenreiter, München, DE;
Michael Bertram, Markt Schwaben, DE;
Martin Ringholz, Erlangen, DE;
Brainlab AG, Feldkirchen, DE;
Abstract
A device and method are provided that enable calibration information to be determined for an x-ray apparatus that performs a three-dimensional x-ray scan. The calibration information is determined using an adapting method, wherein the adapting method is based on a position of an x-ray source relative to an x-ray unit marker device during image acquisition, an x-ray unit data set that describes the position of the x-ray unit marker device during image acquisition, and a two-dimensional calibration data set that describes at least one and preferably two actual two-dimensional x-ray images produced by irradiating a calibration object.