The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2011
Filed:
Dec. 27, 2007
Francis Howard Little, Cincinnati, OH (US);
Yanyan Wu, Schenectady, NY (US);
Jian LI, Rexford, NY (US);
Nicholas J. Kray, Blue Ash, OH (US);
Francis Howard Little, Cincinnati, OH (US);
Yanyan Wu, Schenectady, NY (US);
Jian Li, Rexford, NY (US);
Nicholas J. Kray, Blue Ash, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method is provided for assembling a measurement device for use in measuring a machine component. The method includes providing a coordinate measuring machine (CMM). The method also includes combining ultrasonic inspection (UT) capabilities and CMM capabilities to form an inspection probe. The inspection probe is installed on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures internal boundaries of the machine component with the UT capabilities.