The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Apr. 18, 2008
Applicants:

Kiran Nagaraja, Monmouth Junction, NJ (US);

Vijay Raghunathan, West Lafayette, IN (US);

Florin Sultan, Princeton, NJ (US);

Srimat Chakradhar, Manalapan, NJ (US);

Nupur Kothari, Los Angeles, CA (US);

Inventors:

Kiran Nagaraja, Monmouth Junction, NJ (US);

Vijay Raghunathan, West Lafayette, IN (US);

Florin Sultan, Princeton, NJ (US);

Srimat Chakradhar, Manalapan, NJ (US);

Nupur Kothari, Los Angeles, CA (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 9/44 (2006.01); G06F 9/45 (2006.01); G06F 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer implemented technique framework, prototype tool and associated methods that provide a high degree of visibility and control over the in-field execution of software in a minimally intrusive manner wherein developer-defined correctness tests and validation logic are embedded into the sensor node itself, making in-field software testing autonomous without necessitating continuous developer participation.


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