The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Mar. 26, 2007
Applicants:

Shuanglin Guo, Cupertino, CA (US);

Terence P. Purcell, Springfield, IL (US);

Yoichi Tsuji, San Jose, CA (US);

Inventors:

Shuanglin Guo, Cupertino, CA (US);

Terence P. Purcell, Springfield, IL (US);

Yoichi Tsuji, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system are presented for quantifying a data page repetition pattern for a database index in a database management system. In one embodiment, the method includes identifying a database index to provide a basis for collecting a data page repetition statistic, the database index having a database index key. The method may also include collecting the data page repetition statistic based on the database index key, wherein the data page repetition statistic quantifies a data page repetition pattern associated with database queries that reference sequential entries of the database index. The method may further include optimizing a data page access process based on the data page repetition statistic. In a further embodiment, the method may utilize both cluster ratio and data page repetition statistics to evaluate data page I/O and CPU cost.


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