The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Mar. 31, 2006
Applicants:

Yang Song, San Jose, CA (US);

Thomas Leung, San Jose, CA (US);

Inventors:

Yang Song, San Jose, CA (US);

Thomas Leung, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an apparatus process digital images. The method according to one embodiment accesses element data representing a plurality of elements belonging to a plurality of digital images; performs a similarity analysis between the elements from the plurality of elements to obtain inter-relational data results relating to the elements; and performs clustering of the plurality of elements, the step of performing clustering including incorporating in the inter-relational data results at least one hard constraint relating to elements from the plurality of elements, to obtain constrained inter-relational data results, performing a spectral analysis to obtain eigenvector results from the constrained inter-relational data results, and performing discretization of the eigenvector results using constrained clustering with a criterion to enforce the at least one hard constraint to obtain clusters.


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