The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Jun. 13, 2007
Applicants:

Chi-jung Weng, Rende Township, Tainan County, TW;

Chan-min Chou, Hsinchu, TW;

Fu-kai Chuang, Hsinchu, TW;

Inventors:

Chi-Jung Weng, Rende Township, Tainan County, TW;

Chan-Min Chou, Hsinchu, TW;

Fu-Kai Chuang, Hsinchu, TW;

Assignee:

Altek Corporation, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image evaluation system and method are provided. The system includes an image register, an evaluation window, an image feature generator, and an evaluation unit. In addition, the image evaluation method includes the steps of in case that the image is a human figure, the image is analyzed based on a basic rule of image composition, and an evaluation score is calculated according to the position of the face feature in the image as analyzed and obtained from the image; in case that the image is a landscape, first if a horizontal line exists in the image is determined, if the answer is affirmative, the evaluation score is calculated based on the inclination of a horizontal line in the image; and the evaluation score is reported to the user as a reference. As such, the user may determine the quality of the image based on the evaluation score.


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