The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2011
Filed:
Jul. 10, 2007
Applicants:
Jan Timmer, Eindhoven, NL;
Peter George Van DE Haar, Eindhoven, NL;
Inventors:
Jan Timmer, Eindhoven, NL;
Peter George Van De Haar, Eindhoven, NL;
Assignee:
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
It is described a gain calibration for a two-dimensional X-ray detector (), in which the gain coefficients for scattered radiation () and direct radiation () are measured or estimated separately. A weighed average may be applied on the appropriate scatter fraction. The scatter fraction depending gain calibration method produces less ring artifacts in X-ray images as compared to known gain calibration methods, which do not take into account the fraction of scattered radiation reaching the X-ray detector ().