The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Sep. 05, 2008
Applicants:

Dong Ho Wu, Olney, MD (US);

Anthony Garzarella, Ellicott City, MD (US);

Inventors:

Dong Ho Wu, Olney, MD (US);

Anthony Garzarella, Ellicott City, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus, for measuring an electric field while minimally perturbing the electric field being measured, includes an analyzing stage and a sensor head. The sensor head is optically coupled to the analyzing stage by a laser probe beam transmitted from the analyzing stage. The sensor head includes an electro optic crystal disposed between two gradient index lenses, where the first gradient index lens emits a laser beam transmitted from the analyzing stage to the sensor head, where the electric field is applied and where, the electro optic crystal transforms the laser beam probe into a phase modulated laser beam. The second gradient index lens transmits the phase modulated laser beam back to the analyzing stage, where polarization optics and a photodetector convert the phase modulated laser beam into an electrical signal representing field strength and phase of the electric field.


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