The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2011
Filed:
Feb. 11, 2008
Thomas H. Jeys, Lexington, MA (US);
Antonio Sanchez-rubio, Lexington, MA (US);
Richard J. Molnar, Harvard, MA (US);
Robert K. Reich, Tyngsborough, MA (US);
Jinendra K. Ranka, Westford, MA (US);
David L. Spears, Acton, MA (US);
Richard M. Osgood, Iii, Winchester, MA (US);
Thomas H. Jeys, Lexington, MA (US);
Antonio Sanchez-Rubio, Lexington, MA (US);
Richard J. Molnar, Harvard, MA (US);
Robert K. Reich, Tyngsborough, MA (US);
Jinendra K. Ranka, Westford, MA (US);
David L. Spears, Acton, MA (US);
Richard M. Osgood, III, Winchester, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A particle detection system that images and detects particles in a fluid flow stream through use of detector array(s) is described. The detection system may include light source arrays that may selectively illuminate a particle in a fluid stream. The detection system may also include a detector array employing smart binning to read the measured signals. The smart binning of the detector array may be achieved through knowledge of an exact particle location provided by a position sensitive detector. The detector array(s) may be low cost based on intelligence built into the system. This particle detection system may be particularly useful for detection and discrimination of different particle types since the read-out of the particle signals can be accomplished with low noise and can be flexible enough to optimize the read out measurements for each particle. The particle detection system may be used, for example, in early warning contamination detection systems and manufacturing processes.