The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2011
Filed:
Oct. 14, 2008
Applicant:
Xin Hua HU, Greeivlle, NC (US);
Inventor:
Xin Hua Hu, Greeivlle, NC (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
Abstract
Method and apparatus for spectrophotometric characterization of turbid materials are provided. An incident light beam is used to illuminate a turbid material sample and optical signals of coherent reflectance, diffuse reflectance, collimated transmittance and diffuse transmittance are measured from the sample as functions of wavelength. The following optical parameters are determined as functions of wavelength for spectrophotometric characterization of the turbid material sample in the spectrum of interest: absorption coefficients μ, scattering coefficient μ, anisotropy factor g and real refractive index n.