The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Jul. 27, 2009
Applicants:

Chisato Urano, Ebina, JP;

Takashi Morikawa, Ebina, JP;

Haruo Harada, Ebina, JP;

Yasunori Okano, Tokyo, JP;

Taijyu Gan, Ebina, JP;

Atsushi Hirano, Ebina, JP;

Hiroshi Arisawa, Ebina, JP;

Inventors:

Chisato Urano, Ebina, JP;

Takashi Morikawa, Ebina, JP;

Haruo Harada, Ebina, JP;

Yasunori Okano, Tokyo, JP;

Taijyu Gan, Ebina, JP;

Atsushi Hirano, Ebina, JP;

Hiroshi Arisawa, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/133 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording device that includes an obtainment unit that obtains image information representing an image; and a voltage application unit that applies a voltage with a frequency according to the image information obtained by the obtainment unit, to a pair of electrodes equipped with a display medium, the display medium having a multi-layered liquid-crystal phase provided between the pair of electrodes, the multi-layered liquid-crystal phase having a first layer capable of assuming a specific alignment when the applied voltage is greater than or equal to a pre-set first voltage threshold, and a second layer capable of assuming a specific alignment when the applied voltage is greater than or equal to a second voltage threshold. An application of a voltage to the pair of electrodes effecting a first voltage component and a second voltage component applied to the first layer and the second layer, respectively.


Find Patent Forward Citations

Loading…