The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2011
Filed:
May. 29, 2009
Michael B. Anderson, Colorado Springs, CO (US);
Tahir M. Hasoon, Menlo Park, CA (US);
Brendan J. Whelan, Discovery Bay, CA (US);
J. Spencer Wright, Sunnyvale, CA (US);
Robert L. Reay, Mountain View, CA (US);
Michael B. Anderson, Colorado Springs, CO (US);
Tahir M. Hasoon, Menlo Park, CA (US);
Brendan J. Whelan, Discovery Bay, CA (US);
J. Spencer Wright, Sunnyvale, CA (US);
Robert L. Reay, Mountain View, CA (US);
Linear Technology Corporation, Milpitas, CA (US);
Abstract
A testing procedure may determine whether a monolithic voltage reference device meets a temperature drift specification. A first non-room temperature output voltage of the monolithic voltage reference device may be measured while the monolithic voltage reference device is at a first non-room temperature which is substantially different than room temperature. First non-room temperature information may be stored in a memory within the monolithic voltage reference device which is a function of the first non-room temperature output voltage. A second non-room temperature output voltage of the monolithic voltage reference device may be measured while the monolithic voltage reference device is at a second non-room temperature which is substantially different than the room temperature and the first non-room temperature. Second non-room temperature information may be stored in the memory without destroying the first non-room temperature information which is a function of the second non-room temperature output voltage. A determination may be made whether the monolithic voltage reference device meets the temperature drift specification based on a computation that is a function of both the first non-room temperature information and the second non-room temperature information.