The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Jun. 28, 2008
Applicants:

Paul H. Shelley, Lakewood, WA (US);

Greg J. Werner, Puyallup, WA (US);

Diane R. Lariviere, Seattle, WA (US);

Gwen M. Gross, Redmond, WA (US);

Inventors:

Paul H. Shelley, Lakewood, WA (US);

Greg J. Werner, Puyallup, WA (US);

Diane R. LaRiviere, Seattle, WA (US);

Gwen M. Gross, Redmond, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01N 21/00 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of non-destructively determining the amount of ultraviolet degradation of a surface and/or paint adhesion characteristics of the surface corresponding with UV damage including determining a physical property of a composite material/surfacing film by providing a series of composite materials/surfacing films which are subjected to increasing UV light exposure to create a set of UV damage standards, collecting mid-IR spectra on those standards, performing data pre-processing and then multivariate calibration on the spectra of the composite materials/surfacing films, and using that calibration to predict the UV damage for samples in question.


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