The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Jul. 20, 2009
Applicants:

Ute Resch-genger, Berlin, DE;

Katrin Hoffmann, Berlin, DE;

Thomas Behnke, Berlin, DE;

Christian Wuerth, Berlin, DE;

Inventors:

Ute Resch-Genger, Berlin, DE;

Katrin Hoffmann, Berlin, DE;

Thomas Behnke, Berlin, DE;

Christian Wuerth, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an optical standard () for the calibration or characterization of optical measuring devices and as a reference system for intensities and intensity measurements. The standard () according to the invention, constructed sandwich-like, comprises a combination of at least two layer-like optical standard modules () having defined optical properties, joinable or joined together plane-parallel, wherein the standard modules () in each instance differ from each other by at least one optical property, namely, by their absorption, emission, scatter and/or reflection properties, and the standard modules () are made so that they enter into physical interaction with electromagnetic radiation striking one of their two principal surfaces ().


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