The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2011

Filed:

Mar. 07, 2007
Applicants:

Matthew J. Dejneka, Corning, NY (US);

Hui Su, Horseheads, NY (US);

Inventors:

Matthew J. Dejneka, Corning, NY (US);

Hui Su, Horseheads, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/76 (2006.01); G01N 33/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A fluorescent ion doped glass (or other fluorescing material) and a method for using the fluorescent ion doped glass to enhance a fluorescence imaging technique are described herein. In one embodiment, the fluorescent ion doped glass (or other fluorescing material) is used as a calibration standard to check the uniformity of an intensity profile of an excitation source. In another embodiment, the fluorescent ion doped glass (or other fluorescing material) is used as an offline calibration standard to normalize a native fluorescence image of one or more test samples (e.g., a protein array). In yet another embodiment, the fluorescent ion doped glass (or other fluorescing material) is used as an online calibration standard to normalize a native fluorescence image of one or more test samples (e.g., a protein array).


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