The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Feb. 16, 2007
Kathryn Allyn Bassin, Harpursville, NY (US);
Brian Richard Lepel, Rochester, MN (US);
Warren James Leslie, Pickering, CA;
Susan Eileen Skrabanek, Talking Rock, GA (US);
Crystal Faye Springer, Marietta, GA (US);
Nathan Gary Steffenhagen, Eau Claire, WI (US);
Kathryn Allyn Bassin, Harpursville, NY (US);
Brian Richard Lepel, Rochester, MN (US);
Warren James Leslie, Pickering, CA;
Susan Eileen Skrabanek, Talking Rock, GA (US);
Crystal Faye Springer, Marietta, GA (US);
Nathan Gary Steffenhagen, Eau Claire, WI (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the invention are generally related to computer systems, and more specifically to the analysis of defects in computer software products. Defects uncovered during software testing may be stored in a data structure as data defects, code defects, or environment defects, along with further data describing a particular nature of the defects. The defects may be analyzed to determine a particular problem area causing the defects. If a particular class of defects is determined to be the dominant class of defects encountered during testing, an analysis path of that class of defects may be followed to determine a cause for the defects in the respective class. Therefore, corrective measures tailored to resolving the defects associated with the determined cause may be taken.