The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

Feb. 15, 2008
Applicant:

Hoi-jin Lee, Seoul, KR;

Inventor:

Hoi-Jin Lee, Seoul, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system on chip (SOC) may include function blocks, and a scan chain in each of the function blocks, the scan chains being adapted to conduct scan test operations in sync with a respective one of a plurality of clock signals having a different phase relative to each other, wherein during an isolation mode, the scan chains test combination circuits of the function blocks, and during an interface mode, the scan chains of adjacent ones of the function blocks test combination circuits between the adjacent ones of the function blocks.


Find Patent Forward Citations

Lee, Hoi-Jin. (2011). System-on-chip performing multi-phase scan chain and method thereof (U.S. Patent No. 7917821). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7917821

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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