The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Oct. 30, 2007
Makoto Aikawa, Tokyo, JP;
Jonathan J. Dement, Austin, TX (US);
Sang H. Dhong, San Jose, CA (US);
Brian K. Flachs, Georgetown, TX (US);
Gilles Gervais, Austin, TX (US);
Iwao Takiguchi, Tokyo, JP;
Tetsuji Tamura, Tokyo, JP;
Makoto Aikawa, Tokyo, JP;
Jonathan J. DeMent, Austin, TX (US);
Sang H. Dhong, San Jose, CA (US);
Brian K. Flachs, Georgetown, TX (US);
Gilles Gervais, Austin, TX (US);
Iwao Takiguchi, Tokyo, JP;
Tetsuji Tamura, Tokyo, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Mechanisms for generating a worst case current waveform for testing of integrated circuit devices are provided. Architectural analysis of an integrated circuit device is first performed to determine an initial worst case power workload to be applied to the integrated circuit device. Thereafter, the derived worst case power workload is applied to a model and is simulated to generate a worst case current waveform that is input to an electrical model of the integrated circuit device to generate a worst case noise budget value. The worst case noise budget value is then compared to measured noise from application of the worst case power workload to a hardware implemented integrated circuit device. The worst case current waveform may be selected for future testing of integrated circuit devices or modifications to the simulation models may be performed and the process repeated based on the results of the comparison.