The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

Jan. 07, 2008
Applicants:

Jayanta Basak, New Delhi, IN;

Martin Keller, Vaihingen, DE;

Laurent Sebastien Mignet, New Delhi, IN;

Sourashis Roy, Karnataka, IN;

Inventors:

Jayanta Basak, New Delhi, IN;

Martin Keller, Vaihingen, DE;

Laurent Sebastien Mignet, New Delhi, IN;

Sourashis Roy, Karnataka, IN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A window size for outlier detection in a time series of a database system is determined. Strength values are calculated for data points using a set of window sizes, resulting at least in one set of strength values for each window size. The strength values increase as a distance between a value of a respective data point and a local mean value increases. For each set of strength values, a weighted sum is calculated based on the respective set of strength values. A weighting function is used to suppress the effect of largest strength values and a window size is selected based on the weighted sums.


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