The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

Jan. 30, 2008
Applicants:

Theodore J. Bohizic, Hyde Park, NY (US);

Ali Y. Duale, Poughkeepsie, NY (US);

Dennis W. Wittig, New Paltz, NY (US);

Inventors:

Theodore J. Bohizic, Hyde Park, NY (US);

Ali Y. Duale, Poughkeepsie, NY (US);

Dennis W. Wittig, New Paltz, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 17/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to measure the test coverage can range from a few instructions to all the instructions. The technique is easily integrated into existing test generation systems and is applicable to both uni- and multi-processing systems.


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