The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

Feb. 11, 2008
Applicants:

Stanislaw Piorek, Hillsborough, NJ (US);

Mark Hamilton, Upton, MA (US);

Kenneth P. Martin, Watertown, MA (US);

Pratheev Sreetharan, Medford, MA (US);

Michael E. Dugas, Londonderry, NH (US);

Paul Estabrooks, Monson, MA (US);

Lee Grodzins, Lexington, MA (US);

Inventors:

Stanislaw Piorek, Hillsborough, NJ (US);

Mark Hamilton, Upton, MA (US);

Kenneth P. Martin, Watertown, MA (US);

Pratheev Sreetharan, Medford, MA (US);

Michael E. Dugas, Londonderry, NH (US);

Paul Estabrooks, Monson, MA (US);

Lee Grodzins, Lexington, MA (US);

Assignee:

Thermo Niton Analyzers LLC, Billerica, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract

A hand-held, self-contained x-ray fluorescence (XRF) analyzer produces a small x-ray spot on a sample to interrogate the elemental composition of a sample region of millimeter-size characteristic dimension. The analyzer includes a collimator for aiming an x-ray beam toward a desired location on the sample and for determining the size of the spot produced on the sample. The analyzer may include a digital camera oriented toward the portion of the sample that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer. The analyzer may generate a reticule in a displayed image to indicate the portion of the sample that is, or would be, illuminated by the x-ray beam. The analyzer may automatically annotate the image of the sample with text or graphics that contain information about the analyzed sample. The image may be stored in the hand -held analyzer or provided for external storage or display.


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