The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Nov. 13, 2007
Erlend Ronnekleiv, Trondheim, NO;
Ole Henrik Waagaard, Trondheim, NO;
Erlend Ronnekleiv, Trondheim, NO;
Ole Henrik Waagaard, Trondheim, NO;
Optoplan AS, Trondheim, NO;
Abstract
Methods and apparatus for interrogating optical sensors with high slew rates using non-uniform sampling are provided. The transmission of optical signals in a non-uniform pattern is employed to allow for demodulation of fringe rates exceeding the commonly understood Nyquist frequency limit given as one half of the mean sampling frequency. By monitoring the time dependent fringe frequency and assuming that the fringe frequency has a limited bandwidth, only a limited bandwidth smaller than the Nyquist bandwidth around the instantaneous fringe frequency needs to be reconstructed at any time.