The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

Apr. 21, 2009
Applicants:

Youngcheol Chae, Seoul, KR;

IN Hee Lee, Seoul, KR;

Jimin Cheon, Yongin-si, KR;

Gunhee Han, Seoul, KR;

Seog Heon Ham, Suwon-si, KR;

Inventors:

Youngcheol Chae, Seoul, KR;

In Hee Lee, Seoul, KR;

Jimin Cheon, Yongin-si, KR;

Gunhee Han, Seoul, KR;

Seog Heon Ham, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for sigma-delta (ΣΔ) analog to digital conversion, the method including receiving an analog signal, sampling the received signal, comparing the sampled signal with a constant reference voltage, providing at least one high-order bit responsive to the constant reference comparison, comparing the sampled signal with a variable reference voltage, providing at least one low-order bit responsive to the variable reference comparison, and combining the at least one high-order bit with the at least one low-order bit; and the apparatus including a comparator, a first ADC portion supplying the comparator with a constant reference voltage for providing at least one high-order bit, and a second ADC portion supplying the comparator with a variable reference voltage for providing at least one low-order bit.


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