The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Mar. 30, 2009
Michael E. Stanley, Mesa, AZ (US);
Mark A. Lancaster, Scottsdale, AZ (US);
Chongli Wu, Gilbert, AZ (US);
Michael E. Stanley, Mesa, AZ (US);
Mark A. Lancaster, Scottsdale, AZ (US);
Chongli Wu, Gilbert, AZ (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
Apparatus and methods are provided for performing a sampling sequence for a plurality of samples. An analog-to-digital conversion module comprises a sampling module, a register, and a sampling control module coupled to the sampling module and the register. The sampling module is configured to convert analog signals into corresponding digital values in response to sampling trigger signals and the register is configured to maintain scan mode criteria for a plurality of samples. The sampling control module is configured to identify a scan mode criterion for a respective sample of the plurality of samples, automatically generate a sampling trigger signal when the scan mode criterion for the respective sample is equal to a first value, and generate the sampling trigger signal in response to a timing trigger signal when the scan mode criterion for the respective sample is equal to a second value.