The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Nov. 02, 2009
Applicant:
Ryan Andrew Jurasek, S. Burlington, VT (US);
Inventor:
Ryan Andrew Jurasek, S. Burlington, VT (US);
Assignee:
Nanya Technology Corp., Kueishan, Tao-Yuan Hsien, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microchip that can calibrate a plurality of circuits on the microchip with a current reference includes: at least a first circuit disposed on the microchip; at least a first local bias generation circuit, for generating a bias current that is input to the first circuit; an external current reference, coupled to the first local bias generation circuit, for updating the bias current; and a calibration logic, coupled to the first local bias generation circuit, for enabling the external current reference to update the bias current according to a valid calibration signal.