The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

May. 28, 2008
Applicants:

Parag Birmiwal, Austin, TX (US);

Robert C. Dixon, Austin, TX (US);

Hien M. Le, Cedar Park, TX (US);

Kirk E. Morrow, Round Rock, TX (US);

Inventors:

Parag Birmiwal, Austin, TX (US);

Robert C. Dixon, Austin, TX (US);

Hien M. Le, Cedar Park, TX (US);

Kirk E. Morrow, Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/16 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Electronic component validation testing is facilitated by a method, system and program product which allows the importation of virtual signals derived from simulation verification testing of the electronic component design into electronic test equipment employed during validation testing of the actual electronic component. The method includes: storing simulation data resulting from simulation testing of an electronic component's design; employing electronic test equipment to perform real-time testing of the actual electronic component and obtain real-time test signals therefor; automatically correlating the stored simulation data with the actual real-time test signals; and performing at least one of overlaying and/or displaying the correlated simulation data as virtual signals with the real-time test signals; and employing a trigger event automatically ascertained from the stored simulation data and triggering the electronic test equipment based thereon, thereby automatically controlling real-time testing of the electronic component via the stored simulation data.


Find Patent Forward Citations

Loading…