The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Apr. 27, 2006
Kazuhiro Tashiro, Kawasaki, JP;
Hitoshi Izuru, Kawasaki, JP;
Kazuhiro Tashiro, Kawasaki, JP;
Hitoshi Izuru, Kawasaki, JP;
Fujitsu Semiconductor Limited, Yokohama, JP;
Abstract
The present invention provides a high-quality semiconductor integrated circuit device, where the semiconductor integrated circuit device, a SiP or especially PoP semiconductor integrated circuit device, enables a simultaneous testing of the reliability of multiple upper and lower semiconductor integrated circuit elements; it also enables a testing of only the non-defective element in case the other is determined defective; moreover, only the defective unit is exchangeable with a non-defective unit. The semiconductor integrated circuit device of the present invention contains multiple semiconductor integrated circuit elements, e.g. semiconductor integrated circuit devicesand, and a circuit boardwhich relays the respective semiconductor integrated circuit elementsand, and at least a part of the circuit board, e.g. test pads, can be electrically connected to an external test apparatus when the semiconductor integrated circuit devicesandare electrically connected to the circuit board