The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Oct. 14, 2008
Eiji Yokoi, Tokyo, JP;
Eiji Yokoi, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
In a laser scanning microscope comprising an infrared pulse laser; an objective lens focusing an infrared light from the infrared pulse laser on a sample; a condenser lens disposed on an opposite side of the objective lens across the sample for collecting an observation light that is generated by a nonlinear optical effect and has a wavelength shorter than a wavelength of the infrared light; a visible light detector detecting the observation light collected by the condenser lens, an IR partial transmission filter having partially-modified transmission characteristics for the infrared light is disposed near a front focal position of the condenser lens, and an infrared light detector detecting, through the IR partial transmission filter, a transmitted light from the sample collected by the condenser lens, is provided.