The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2011
Filed:
Oct. 16, 2008
Len Higashi, Pearl City, HI (US);
Fernd Engelen, Bothell, WA (US);
Peter Bristol, Shoreline, WA (US);
Cathy Owen, Honolulu, HI (US);
Dan Blase, Everett, WA (US);
Dexter Poon, Honolulu, HI (US);
Len Higashi, Pearl City, HI (US);
Fernd Engelen, Bothell, WA (US);
Peter Bristol, Shoreline, WA (US);
Cathy Owen, Honolulu, HI (US);
Dan Blase, Everett, WA (US);
Dexter Poon, Honolulu, HI (US);
Nanopoint, Inc., Honolulu, HI (US);
Abstract
A method and system for providing a container for investigating at least one specimen are described. The method and system include providing a dish. The dish includes a floor, a plurality of sidewalls, and at least one pedestal. The floor has a perimeter. The plurality of sidewalls coupled with the floor proximate to the perimeter. The at least one pedestal resides on a portion of the floor and is pedestal configured to support at least one microscope slide distal from the floor. The at least one microscope slide bears the specimen(s) for investigation.