The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

May. 15, 2007
Applicant:

Michael Diez, Erlangen, DE;

Inventor:

Michael Diez, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an x-ray apparatus with an x-ray source and an x-ray detector, with the x-ray source able to be moved in a first plane and the x-ray detector in a second plane parallel to the first plane and not coinciding with the first plane, with the x-ray source and the x-ray detector always able to be aligned to one another, and a object under examination being able to be arranged between the first plane and the second plane, with, by means of a movement of the x-ray source and a movement of the x-ray detector adapted to the movement of the x-ray source, as well as by means of x-rays leaving the x-ray source, penetrating the object under examination and detected by the x-ray detector, a plurality of two-dimensional projections of the object under examination being able to be recorded in different projection directions relative to the object under examination, from which a spatial presentation of the object under examination is able to be determined.


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