The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7912828 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 22, 2011

Filed:

Feb. 23, 2007
Applicants:

Olivier Bonnet, Paris, FR;

Frédéric DE Jaeger, Paris, FR;

Toby Paterson, Paris, FR;

Inventors:

Olivier Bonnet, Paris, FR;

Frédéric De Jaeger, Paris, FR;

Toby Paterson, Paris, FR;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 15/16 (2006.01); G10L 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-based method for identifying patterns in computer text using structures defining types of patterns which are to be identified, wherein a structure comprises one or more definition items, the method comprising assigning a weighting to each structure and each definition item; searching the computer text for a pattern to be identified on the basis of a particular structure, a pattern being provisionally identified if it matches the definition given by said particular structure; in a provisionally identified pattern, determining those of the definition items making up said particular structure that have been identified in the provisionally identified pattern; combining the weightings of the determined definition items and optionally, the weighting of the particular structure, to a single quantity; assessing whether the single quantity fulfils a given condition; depending on the result of said assessment, rejecting or confirming the provisionally identified pattern.


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