The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Mar. 27, 2003
Marcel Vasilache, Tampere, FI;
Marcel Vasilache, Tampere, FI;
Nokia Corporation, Espoo, FI;
Abstract
A method for determining a set of distortion measures in a pattern recognition process, where a sequence of feature vectors is formed from a digitized incoming signal to be recognized, said pattern recognition being based upon said set of distortion measures. The method comprises comparing (S) a first feature vector in said sequence with a first number (M) of templates from a set of templates representing candidate patterns, based on said comparison, selecting (S) a second number (M) of templates from said template set, the second number being smaller than the first number, and comparing (S) a second feature vector only with said selected templates. The method can be implemented in a device for pattern recognition.