The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Jun. 17, 2008
Seung H. Lee, Bellevue, WA (US);
Charles Z. Loboz, Redmond, WA (US);
Zhongsheng Yuan, Bellevue, WA (US);
Seung H. Lee, Bellevue, WA (US);
Charles Z. Loboz, Redmond, WA (US);
Zhongsheng Yuan, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Analysis may be made of the amount that a load on a machine impacts the machine's performance. Performance counters on the machine record raw statistical data, such as a given resource's current utilization. The values of these counters may be captured. A n-bin histogram may be created that shows how many of the captured performance counter values occur within various ranges, such as 0-10% utilization, 10-20%, etc. A weight may be assigned to each bin. A weighted sum of the bins may be calculated by multiplying the number of occurrences in each bin by the bin's weight, and adding the products together. The weights may be chosen to reflect the relative amounts that particular performance counter values impact the overall performance of a machine. Thus, a metric that represents performance impact may be calculated based on the weighted sum.